Black Silicon Based Iris with Reduced Light Scattering and Reflection

This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was... [ view full abstract ]

This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0^th order disk much sharper.