Deep Silicon Etching for X-Ray Diffraction Devices Fabrication

Abstract

We report deep reactive ion etching of silicon gratings via cryogenic and Bosch processes. An aspect ratio of > 50 is achieved for 400 nm period gratings with both processes.   [ view full abstract ]

Authors

  1. Houxun Miao (NIH)
  2. Mona Mirzaeimoghri (University of Maryland, College Park/NIH)
  3. Lei Chen (NIST CNST)
  4. Han Wen (NIH)

Topic Areas

Biomedical optical devices and nano-biophotonics , Nanofabrication, packaging and integration

Session

Mo-3 » Systems and applications (15:30 - Monday, 14th August, Sierra/Cumbre/Vista)

Paper

OMN2017_Houxun.pdf