HIL and RCP capabilities of real-time digital simulators for MMC and other power converter applications
Maxim Beaudoin and Wei Li
OPAL-RT TECHNOLOGIES
Abstract
The Modular Multilevel Converter (MMC) is an emerging topology suitable for very high voltage applications that has been increasingly commissioned around the world as a result of its significant advantages. To guaranty the... [ view full abstract ]
The Modular Multilevel Converter (MMC) is an emerging topology suitable for very high voltage applications that has been increasingly commissioned around the world as a result of its significant advantages. To guaranty the most efficient performance and mitigate risks associated of any malfunctions, it is crucial for MMC manufacturers to tests their controllers, and to validate for all possible scenarios using a hardware-in-the-loop (HIL) test bench before they are commissioned in the field. However, due to the complexity of MMC control and the level of engineering expertise required to operate these systems, it has become the norm to resort to third-party experts to provide the cutting-edge technologies dedicated to the hardware verification of new control algorithms for new and existing power electronic converter.
With nearly two decades of expertise in the development of PC/FPGA Based Real-Time Simulators, Hardware-In-the-Loop (HIL) testing equipment and Rapid Control Prototyping (RCP) systems, OPAL-RT Technologies is a world leader in engineering equipment and software used for experimental work on converter interactions and network control. This tutorial will explain the main challenges of an HIL test bench for a complicated MMC system and the solutions provided by OPAL-RT Technologies. The capabilities of the test bench for fast or real time simulation, and rapid control prototyping (RCP) study of power girds and renewable energies with power electronic devices will be covered. A live technical demo will also be executed to demonstrate how the scalable OPAL-RT's platforms can perform consecutive automated tests and protection scheme under various fault conditions for small MMC system with few cells or very large simulator for MMC system including thousands of cells.
Session
TUT-7 » Tutorial (13:00 - Monday, 27th June, Plaza B)