Session: TUE-3A
Reliability Solutions and Improvements

Chair

Seiki Igarashi - Fuji Electric

Time

13:35 - 14:55 on Tuesday, 28th of June 2016

Venue

Plaza A

13:35

Mission Profile Based Sizing of IGBT Chip Area for PV Inverter Applications

Yanfeng Shen (Aalborg University), Huai Wang (Aalborg University), Yongheng Yang (Aalborg University), Paula Diaz Reigosa (Aalborg University), Frede Blaabjerg (Aalborg University)
13:55

Active Gate Driving Method for Reliability Improvement of IGBTs via Junction Temperature Swing Reduction

Haoze Luo (Aalborg University), Francesco Iannuzzo (Aalborg University), Ke Ma (Aalborg University), Frede Blaabjerg (Aalborg University), Wuhua Li (Zhejiang University), Xiangning He (Zhejiang University)
14:15

Advanced Derating Strategy for Extended Lifetime of Power Electronics in Wind Power Applications

Ionut Vernica (Aalborg University), Ke Ma (Aalborg University), Frede Blaabjerg (Aalborg University)
14:35

Fault Diagnosis of Modular Multilevel Converters Based on Extended State Observer

Xing Hu (Southeast University), Jianzhong Zhang (Southeast University), Shuai Xu (Southeast University), Yongjiang Jiang (Southeast University)