Session: OS1b-A
Quantum sensors and quantum metrology

David Vitali (University of Camerino), Giovanni Di Giuseppe (University of Camerino), Riccardo Natali (University of Camerino), Nenad Kralj (University of Camerino), Stefano Zippilli (University of Camerino), Massimiliano Rossi (University of Copenhagen), Paolo Piergentili (University of Camerino), Nicola Malossi (University of Camerino), Mateusz Bawaj (University of Camerino), Letizia Catalini (University of Camerino)

Lorenzo Maccone (universita' di Pavia)

Eric Charron (ISMO, Université Paris-Sud), Robin Corgier (Institut für Quantenoptik, Leibniz Universität Hannover), Sirine Amri (ISMO, Université Paris-Sud), David Guéry-odelin (LCAR, Université de Toulouse), Ernst M. Rasel (Institut für Quantenoptik, Leibniz Universität Hannover), Naceur Gaaloul (Institut für Quantenoptik, Leibniz Universität Hannover)

Romain Karcher (Observatoire de Paris), Almazbek Imanaliev (Observatoire de Paris), Sébastien Merlet (Observatoire de Paris), Franck Pereira dos Santos (Observatoire de Paris)

Sebastian de Graaf (National Physical Laboratory), Sebastian T. Skacel (Karlsruhe Institute of Technology), Teresa Hönigl-decrinis (Royal Holloway, University of London), Rais Shaikhaidarov (Royal Holloway, University of London), Hannes Rotzinger (Karlsruhe Institute of Technology), Sven Linzen (Leibniz institute for photonic technology), Mario Ziegler (Leibniz institute for photonic technology), Vladimir Antonov (Royal Holloway, University of London), Uwe Hubner (Leibniz institute for photonic technology), Hans-georg Meyer (Leibniz institute for photonic technology), Evgeni Il'ichev (Leibniz institute for photonic technology), Alexey V. Ustinov (Karlsruhe Institute of Technology), Alexander Tzalenchuk (National Physical Laboratory), Oleg Astafiev (Royal Holloway, University of London)

Sergei Slussarenko (Griffith University), Morgan M. Weston (Griffith University), Helen M. Chrzanowski (University of Oxford), Lynden K. Shalm (National Institute of Standards and Technology), Varun B. Verma (National Institute of Standards and Technology), Sae Woo Nam (National Institute of Standards and Technology), Geoff J. Pryde (Griffith University)