High performance micro/nanofabricated AFM-TERS probes based on a metallic nanocone/nanodisk integrated on silicon cantilever


Lille 1 University

PhD Student :  in Physics, starting second years. CIFRE Convention (Industrial Agreements Training by the Research). Tip Enhancement Raman Scattering and Probes' Researches.Company : HORIBA Scientifique, R&D Department, Raman Micro/Spectroscopy Research, Horiba Jobin-Yvon SAS. 231, rue de Lille - 59650 Villeneuve d'Ascq, +33 1 69 74 72 00Laboratory : IEMN, Nano-characterization and Near-Field Microscopy Platforms, Micro and Nano-fabrication Centre - Silicon Technology, IEMN-CNRS UMR8520 Avenue Poincaré CS 600669, F-59652 Villeneuve d'Ascq, +33 3 20 19 79 79


We present modelling, fabrication and characterization of atomic force microscopy-tip enhancement Raman spectroscopy (AFM–TERS) probes which demonstrate a very high electromagnetic (EM) enhancement due to a novel metallic... [ view full abstract ]


  1. Damien ESCHIMESE (Lille 1 University)

Topic Areas

Optical properties of nanostructures , New instrumentation for spectroscopy and microscopy


OS2-105a » Optical properties of nanostructures (14:30 - Thursday, 8th December, Tower 24 - Room 105)

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