Effect of thickness on physical and waveguiding properties of nanostructured AZO thin films by a sol-gel dip-coating method
Abstract
In the present work, 3.0 at. % aluminum doped zinc oxide (AZO) thin films were prepared at different number of coatings (6, 12, 18 and 24) on glass substrates by a sol-gel dip-coating process. The effect of film thickness on... [ view full abstract ]
In the present work, 3.0 at. % aluminum doped zinc oxide (AZO) thin films were prepared at different number of coatings (6, 12, 18 and 24) on glass substrates by a sol-gel dip-coating process. The effect of film thickness on structural, morphological, optical and waveguiding properties of AZO thin films was studied through X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), UV-Visible-NIR spectrophotometer and m-lines spectroscopy (MLS). XRD analysis showed that all the AZO films are polycrystalline and exhibit the hexagonal wurtzite crystal structure with a preferential growth orientation along the c-axis. The relative intensity of the (002) diffraction peak and crystallite size tend to increase with an increase in the number of layers indicating an improvement in the crystallinity of the films. SEM micrographs and AFM images revealed that the 6 layers AZO film exhibits very smooth surface consisted of small grain size particles, along with some pores over the film. In comparison, the surface of the films becomes denser and rougher with the grain size enlarged as the number of layers increases. Optical transmittance spectra showed that all of the multilayer films exhibited a high average transmittance (84-88%) in the visible region with the sharp absorption edge in the UV light region. It was also found that the band gap energy, calculated from the spectra of optical transmittance, show a significant dependence on the number of coatings. MLS measurements at 632.8 nm wavelength put into evidence that multilayer AZO planar waveguides support single and multi-well confined guided modes for both transverse electric (TE) and transverse magnetic (TM) polarizations. The film refractive index increase with thickness and reach a saturation value when the number of layers is higher than 12. Moreover, the 24 layers AZO planar waveguide shows propagation loss lower than 1 dB/cm for a wavelength of 632.8 nm.
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Authors
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Khamsa NECIB
(Laboratoire des Semiconducteurs, Université Badji Mokhtar-Annaba, Algeria)
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Tahar TOUAM
(Laboratoire des Semi-conducteurs, Université Badji Mokhtar-Annaba, BP 12, Annaba 23000, Algeria)
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Azeddine CHELOUCHE
(Laboratoire de Génie de l'Environnement, Faculté de Technologie, Université de Bejaia, 06000 Bejaia)
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Lydia OUAREZ
(Laboratoire de Génie de l'Environnement, Faculté de Technologie, Université de Bejaia, 06000 Bejaia, Algeria)
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Djamal DJOUADI
(Laboratoire de Génie de l'Environnement, Faculté de Technologie, Université de Bejaia, 06000 Bejaia, Algeria)
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Laid HAMMICHE
(Laboratoire de Génie de l'Environnement, Faculté de Technologie, Université de Bejaia, 06000 Bejaia, Al)
Topic Areas
Photonic & plasmonic nanomaterials , Optical properties of nanostructures , Sol-Gel optical materials
Session
PS2 » Poster Session (13:30 - Thursday, 19th October, Hall & Room 3)
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