Test methodology for measuring resistance and capacitance leakage current in Integrated Compensators Intended for Automotive Applications


In this work, a test methodology is presented, describing how the components of a fully integrated type III compensator have been measured. More in particular, two different methodologies have been implemented, in order to... [ view full abstract ]


  1. Stephen Ogunniran (On Semiconductor Ireland Ltd.)
  2. Tallita Sobral (On Semiconductor Ireland Ltd.)
  3. Pasquale Napolitano (On Semiconductor Ireland Ltd.)
  4. Ihsan Albittar (On Semiconductor Ireland Ltd.)

Topic Areas

Systems on a chip design , VLSI, ASIC and FPGAs for signal processing , Other


Poster » Poster Session (14:50 - Thursday, 21st June, Ashby Building Foyer)

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