Test methodology for measuring resistance and capacitance leakage current in Integrated Compensators Intended for Automotive Applications
Abstract
In this work, a test methodology is presented, describing how the components of a fully integrated type III compensator have been measured. More in particular, two different methodologies have been implemented, in order to... [ view full abstract ]
Authors
- Stephen Ogunniran (On Semiconductor Ireland Ltd.)
- Tallita Sobral (On Semiconductor Ireland Ltd.)
- Pasquale Napolitano (On Semiconductor Ireland Ltd.)
- Ihsan Albittar (On Semiconductor Ireland Ltd.)
Topic Areas
Systems on a chip design , VLSI, ASIC and FPGAs for signal processing , Other
Session
Poster » Poster Session (14:50 - Thursday, 21st June, Ashby Building Foyer)
Presentation Files
The presenter has not uploaded any presentation files.