Surface profile 3D visualization from thickness map reconstruction of thin films using scattering of surface plasmon polaritons

Rodolfo Cortés-Martínez

CICESE, Unidad Monterrey

Dr. Rodolfo Cortes obtained his PhD degree in 2000 at the same institute. After hisPhD, he spent 1 year as a postdoc researcher in the Heriot-Watt Universityworking mainly in diffractive optics for high power laser applications. Hisresearch focuses on evanescent waves phenomena, near field microscopy withmicrowaves and visualization techniques applied to metrology. Dr. Cortes haspublished over 17 internationally peer-reviewed journal papers and hassupervised 2 Master thesis. He is a member of the Mexican National System ofResearchers (Level 1). Currently, Dr. Cortes has a full-time research positionin CICESE, Unidad Monterrey.


We present a method to obtain wide (~mm2) three-dimensional (3D) thickness maps of dielectric thin films, with sub-nanometer precision, using the scattering produced by surface plasmon polaritons (SPPs). SPPs are... [ view full abstract ]


  1. Rodolfo Cortés-Martínez (CICESE, Unidad Monterrey)
  2. César E. García-Ortiz (CICESE, Unidad Monterrey)
  3. Raúl Hernández-Aranda (Tecnológico de Monterrey)
  4. Felix Aguilar-Valdez (INAOE)
  5. Víctor M. Coello-Cárdenas (CICESE, Unidad Monterrey)

Topic Areas

Photonic & plasmonic nanomaterials , Optical properties of nanostructures , Advanced imaging for photonic materials


OS3b-2 » Advanced imaging for photonic materials (16:40 - Wednesday, 3rd October, ROOM 2)

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