Revealing local material properties with high resolution optical microscopy


The high resolution optical technique combining scanning probe microscopy and optical microscopy has shown its distinct capability in characterizing materials with high sensitivity and topography information [1]. We actively... [ view full abstract ]


  1. Marius Van Den Berg (University of Tübingen)
  2. Tobias Koeninger (University of Tübingen)
  3. Yu-ting Chen (University of Tübingen)
  4. Anke Horneber (University of Tübingen)
  5. Alfred Meixner (University of Tübingen)
  6. Dai Zhang (Eberhard Karls University of Tübingen)

Topic Areas

Photonic & plasmonic nanomaterials , Optical properties of nanostructures , Enhanced spectroscopy and sensing


OS2b-2 » Enhanced spectroscopy and sensing (16:50 - Tuesday, 2nd October, ROOM 2)

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